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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Język AngielskiAngielski
Książka Twarda
Książka Terrestrial Radiation Effects in ULSI Devices and Electronic Systems Eishi H. Ibe
Kod Libristo: 01401942
Wydawnictwo John Wiley & Sons Inc, luty 2015
Covers faults in ULSI devices to failures in electronic systems caused by a wide variety of radiatio... Cały opis
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Covers faults in ULSI devices to failures in electronic systems caused by a wide variety of radiation fields, including electrons, alpha -rays, muons, gamma rays, neutrons and heavy ions. Readers will learn the environmental radiation features at the ground or avionics altitude. Readers will also learn how to make numerical models from physical insight and what kind of mathematical approaches should be implemented to analyze the radiation effects. A wide variety of mitigation techniques against soft-errors are reviewed and discussed.§The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them. The book provides the reader with the knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. It explains how electronic systems including servers and routers are shut down due to environmental radiation. It also details how to quantify such effects by constructing physical models and numerical algorithms.§Contents includes:-§Principle of Radiation Effects (Radiation Effects by Gamma-ray/Electrons (Beta ray)/Muons/Protons/Alpha-Particles/Heavy Ions/Low-Energy Neutrons)§Environmental Radiation Fields (Cosmic Rays from Galaxy Core and Sun/Radioisotopes in the Field)§Soft Errors in Semiconductor Memory Devices§Radiation Induced Failures in Electronic Components and Systems§Summary of Radiation Effects in Electronic Devices and Systems§Appendix ( Basic Knowledge of Visual Basic/Database handling by Visual Basic and SQL/Algorithms and sample codes)

Informacje o książce

Pełna nazwa Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Autor Eishi H. Ibe
Język Angielski
Oprawa Książka - Twarda
Data wydania 2015
Liczba stron 296
EAN 9781118479292
ISBN 1118479297
Kod Libristo 01401942
Wydawnictwo John Wiley & Sons Inc
Waga 620
Wymiary 169 x 249 x 22
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